Volume 6 Issue 1 December - February
2018
Review Paper
Dharmendra Singh*, Ankit Singh**,
Prachi Agrawal***, Harshita Agrawal****
*-** Assistant Professor, Department
of Electronics and Telecommunication Engineering, SSIPMT, Raipur, India.
***-**** UG Scholar, Department of
Electronics and Telecommunication Engineering, SSIPMT, Raipur, India.
Singh, D., Singh, A., Agrawal, P.,
and Agrawal, H. (2018). Low Power Optimization Technique Based Linear Feedback
Shift Register. i-manager’s Journal on Circuits and Systems, 6(1),
20-24. https://doi.org/10.26634/jcir.6.1.14058
Abstract
In Very-Large-Scale
Integration (VLSI), the main challenges for the researchers are to reduce the
power dissipation by the devices. In this paper, the authors have proposed a
modified version of the Linear Feedback Shift Register to meet the specific output.
The power consumption can be reduced by deactivating the clock signal from the
flip flop to design test pattern generator during testing power. The LFSR
pseudo-random test pattern generator is used in the testing of the ASIC chips,
which is used to generate the random sequences of the desired pattern
generator. This paper will help in the reduction of additional test inputs used
for the ASIC. The test pattern is generated in such a way that the component
requirements can be reduced.
Comments
Post a Comment